Dr. Dirk Weiler
Head of Department at Fraunhofer-IMS
SPIE Involvement:
Publications (7)

Proceedings Article | 9 October 2018
Proc. SPIE. 10795, Electro-Optical and Infrared Systems: Technology and Applications XV
KEYWORDS: Microbolometers, Readout integrated circuits, Sensors, Temperature metrology, Thermography, Black bodies, Infrared radiation, Semiconducting wafers

Proceedings Article | 29 May 2018
Proc. SPIE. 10624, Infrared Technology and Applications XLIV
KEYWORDS: Microbolometers, Semiconducting wafers, Amorphous silicon, Temperature metrology, Readout integrated circuits, Black bodies, Sensors, Analog electronics, Antireflective coatings, Interfaces

Proceedings Article | 20 May 2016
Proc. SPIE. 9819, Infrared Technology and Applications XLII
KEYWORDS: Microbolometers, Electro optics, Readout integrated circuits, Absorption, Reflectors, Resistance, Semiconducting wafers, Infrared radiation, Nanolithography, Optical resonators

Proceedings Article | 24 June 2014
Proc. SPIE. 9070, Infrared Technology and Applications XL
KEYWORDS: Microbolometers, Sensors, Semiconducting wafers, Amorphous silicon, Readout integrated circuits, Thermography, Packaging, Electro optics, Bolometers, Absorption

Proceedings Article | 21 May 2011
Proc. SPIE. 8012, Infrared Technology and Applications XXXVII
KEYWORDS: Microbolometers, Amorphous silicon, Ceramics, Semiconducting wafers, Readout integrated circuits, Thermography, Resistance, Packaging, Electro optics, Analog electronics

Showing 5 of 7 publications
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