Dr. Dmitri L. Boiko
Senior Expert at CSEM SA
SPIE Involvement:
Publications (9)

Proceedings Article | 1 March 2019
Proc. SPIE. 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology
KEYWORDS: Diffraction, Sensors, Photons, Entangled states, Diffraction gratings, Correlation function

Proceedings Article | 1 March 2019
Proc. SPIE. 10939, Novel In-Plane Semiconductor Lasers XVIII
KEYWORDS: Quantum wells, Transparency, Modulation, Mode locking, Semiconductor lasers, Frequency modulation, Laser stabilization, Picosecond phenomena, Pulsed laser operation

Proceedings Article | 19 February 2018
Proc. SPIE. 10553, Novel In-Plane Semiconductor Lasers XVII
KEYWORDS: Ultrafast phenomena, Mirrors, Quantum wells, Mode locking, Semiconductor lasers, Distance measurement, Optical resonators, Picosecond phenomena, Acoustics, Pulsed laser operation

Proceedings Article | 20 February 2017
Proc. SPIE. 10123, Novel In-Plane Semiconductor Lasers XVI
KEYWORDS: Quantum wells, Transparency, Continuous wave operation, Mode locking, Laser applications, Optical fabrication, Semiconductor lasers, Optical metrology, Laser resonators, Distance measurement, Aluminum, Laser damage threshold, Picosecond phenomena, Laser metrology, Pulsed laser operation, Absorption

Proceedings Article | 27 January 2017
Proc. SPIE. 10111, Quantum Sensing and Nano Electronics and Photonics XIV
KEYWORDS: CMOS sensors, Beam splitters, Imaging systems, Sensors, Photons, Image resolution, Image sensors, CMOS technology, Quantum optics, Single photon detectors

Showing 5 of 9 publications
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