Dominik Schraml
at Steinbeis Qualitätssicherung und Bildverarbeitung GmbH
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 17 September 2019
Proc. SPIE. 11144, Photonics and Education in Measurement Science 2019
KEYWORDS: Data modeling, Cameras, Image segmentation, Ray tracing, Light sources and illumination, Artificial intelligence, 3D image processing

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