Donald B. T. Kilgus
Engineer - Principle Test Design at
SPIE Involvement:
Author
Publications (10)

Proceedings Article | 20 January 1997
Proc. SPIE. 2909, Three-Dimensional Imaging and Laser-Based Systems for Metrology and Inspection II
KEYWORDS: Mirrors, Stereoscopy, Scanners, Video, Crystals, Semiconductor lasers, Laser scanners, Electro optics, Acoustics, Diffraction gratings

Proceedings Article | 20 January 1997
Proc. SPIE. 2909, Three-Dimensional Imaging and Laser-Based Systems for Metrology and Inspection II
KEYWORDS: Holography, Modulation, Scanners, Semiconductor lasers, Laser scanners, Diodes, 3D scanning, Acousto-optics, Laser systems engineering, Diffraction gratings

Proceedings Article | 19 January 1996
Proc. SPIE. 2599, Three-Dimensional and Unconventional Imaging for Industrial Inspection and Metrology
KEYWORDS: Mirrors, Imaging systems, Sensors, Stereoscopy, Inspection, 3D metrology, 3D scanning, 3D image processing, Laser systems engineering, Lead

Proceedings Article | 19 January 1996
Proc. SPIE. 2599, Three-Dimensional and Unconventional Imaging for Industrial Inspection and Metrology
KEYWORDS: Monochromatic aberrations, Imaging systems, Sensors, Error analysis, Reflectivity, Receivers, Distortion, Image sensors, 3D metrology, 3D image processing

Proceedings Article | 15 March 1994
Proc. SPIE. 2065, Optics, Illumination, and Image Sensing for Machine Vision VIII
KEYWORDS: Imaging systems, Speckle, Sensors, Stereoscopy, Inspection, Image resolution, 3D metrology, Optical resolution, 3D scanning, 3D image processing

Proceedings Article | 6 January 1994
Proc. SPIE. 2348, Imaging and Illumination for Metrology and Inspection
KEYWORDS: Monochromatic aberrations, Optical design, Visualization, Imaging systems, Calibration, Stereoscopy, Distortion, Digital imaging, Systems modeling, Line scan image sensors

Showing 5 of 10 publications
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