Dr. Donald A. Walko
Physicist at Argonne National Laboratory
SPIE Involvement:
Author
Area of Expertise:
X-ray diffraction , Time-resolved diffraction
Publications (4)

PROCEEDINGS ARTICLE | August 23, 2017
Proc. SPIE. 10386, Advances in X-Ray/EUV Optics and Components XII
KEYWORDS: Microelectromechanical systems, Diffraction, Optical design, X-ray optics, Modulation, X-rays, Reflectivity, Micromirrors, Synchrotrons, Geometrical optics

PROCEEDINGS ARTICLE | August 23, 2017
Proc. SPIE. 10386, Advances in X-Ray/EUV Optics and Components XII
KEYWORDS: Microelectromechanical systems, X-ray optics, Modulation, X-rays, Silicon, Modulators, Micromirrors, Synchrotrons, Picosecond phenomena, EUV optics

PROCEEDINGS ARTICLE | October 15, 2012
Proc. SPIE. 8502, Advances in X-Ray/EUV Optics and Components VII
KEYWORDS: Microelectromechanical systems, Mirrors, Modulation, Sensors, X-rays, Reflectivity, Control systems, Micromirrors, Measurement devices, Synchrotrons

PROCEEDINGS ARTICLE | June 28, 2005
Proc. SPIE. 5838, Nanotechnology II
KEYWORDS: Nanostructures, Indium arsenide, Scattering, Sensors, X-rays, Interfaces, Gallium antimonide, Chemical analysis, Antimony, Heterojunctions

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top