Dr. Donald A. Walko
Physicist at Argonne National Laboratory
SPIE Involvement:
Author
Area of Expertise:
X-ray diffraction , Time-resolved diffraction
Publications (4)

PROCEEDINGS ARTICLE | August 23, 2017
Proc. SPIE. 10386, Advances in X-Ray/EUV Optics and Components XII
KEYWORDS: Microelectromechanical systems, Synchrotrons, X-rays, Micromirrors, Diffraction, X-ray optics, Reflectivity, Geometrical optics, Optical design, Modulation

PROCEEDINGS ARTICLE | August 23, 2017
Proc. SPIE. 10386, Advances in X-Ray/EUV Optics and Components XII
KEYWORDS: X-rays, X-ray optics, Microelectromechanical systems, Micromirrors, Synchrotrons, Silicon, EUV optics, Modulators, Modulation, Picosecond phenomena

PROCEEDINGS ARTICLE | October 15, 2012
Proc. SPIE. 8502, Advances in X-Ray/EUV Optics and Components VII
KEYWORDS: X-rays, Mirrors, Modulation, Micromirrors, Microelectromechanical systems, Reflectivity, Synchrotrons, Sensors, Measurement devices, Control systems

PROCEEDINGS ARTICLE | June 28, 2005
Proc. SPIE. 5838, Nanotechnology II
KEYWORDS: Interfaces, Gallium antimonide, Indium arsenide, X-rays, Heterojunctions, Chemical analysis, Scattering, Nanostructures, Antimony, Sensors

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