Dr. Donald A. Walko
Physicist at Argonne National Lab
SPIE Involvement:
Author
Area of Expertise:
X-ray diffraction , Time-resolved diffraction
Publications (5)

Proceedings Article | 9 September 2019
Proc. SPIE. 11108, Advances in X-Ray/EUV Optics and Components XIV
KEYWORDS: Microelectromechanical systems, Diffraction, X-ray optics, Sensors, Crystals, X-rays, X-ray diffraction, Silicon, Micromirrors, Monochromators

Proceedings Article | 23 August 2017
Proc. SPIE. 10386, Advances in X-Ray/EUV Optics and Components XII
KEYWORDS: Microelectromechanical systems, X-ray optics, Modulation, X-rays, Silicon, Modulators, Micromirrors, Synchrotrons, Picosecond phenomena, EUV optics

Proceedings Article | 23 August 2017
Proc. SPIE. 10386, Advances in X-Ray/EUV Optics and Components XII
KEYWORDS: Microelectromechanical systems, Diffraction, Optical design, X-ray optics, Modulation, X-rays, Reflectivity, Micromirrors, Synchrotrons, Geometrical optics

Proceedings Article | 15 October 2012
Proc. SPIE. 8502, Advances in X-Ray/EUV Optics and Components VII
KEYWORDS: Microelectromechanical systems, Mirrors, Modulation, Sensors, X-rays, Reflectivity, Control systems, Micromirrors, Measurement devices, Synchrotrons

Proceedings Article | 28 June 2005
Proc. SPIE. 5838, Nanotechnology II
KEYWORDS: Nanostructures, Indium arsenide, Scattering, Sensors, X-rays, Interfaces, Gallium antimonide, Chemical analysis, Antimony, Heterojunctions

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