Dr. Dong-Hyun Kim
at Lawrence Berkeley National Lab
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | February 12, 2008
Proc. SPIE. 6883, Advanced Fabrication Technologies for Micro/Nano Optics and Photonics
KEYWORDS: Gold, Diffraction, X-rays, X-ray microscopy, Optical alignment, Zone plates, Plating, X-ray imaging, Nanofabrication, Overlay metrology

PROCEEDINGS ARTICLE | May 23, 2005
Proc. SPIE. 5843, Fluctuations and Noise in Materials II
KEYWORDS: Thin films, Microscopes, Statistical analysis, Ferromagnetics, Visualization, X-rays, Magnetism, Spatial resolution, Stochastic processes, Anisotropy

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