Dong-Jin Shim
Postdoctoral Associate at Massachusetts Institute of Technology
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | July 22, 2003
Proc. SPIE. 5045, Testing, Reliability, and Application of Micro- and Nano-Material Systems
KEYWORDS: Photomicroscopy, Inspection, Adhesives, Reliability, Manufacturing, Polishing, Microelectronics, Ceramics, Testing and analysis, Microscopes

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