Dr. Dong-Kun Lee
Research Manager at SK Siltron Co Ltd
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 28 February 2008 Paper
Doo Soo Kim, Ho Jun Lee, Yong Jin Kim, Su Kim Jung, Dong Kun Lee, Bo Young Lee
Proceedings Volume 6894, 689406 (2008) https://doi.org/10.1117/12.765705
KEYWORDS: Gallium nitride, Silicon, Semiconducting wafers, Metalorganic chemical vapor deposition, Crystals, Etching, Vapor phase epitaxy, Diffraction, Optical properties, Sapphire

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