Dong Soo Kim
at KAIST
SPIE Involvement:
Author
Publications (6)

Proceedings Article | 18 June 2013
Proc. SPIE. 8704, Infrared Technology and Applications XXXIX
KEYWORDS: Long wavelength infrared, Infrared sensors, Antireflective coatings, Annealing, Germanium, Nickel, Silicon, Coating, Transmittance, Semiconducting wafers

Proceedings Article | 21 May 2011
Proc. SPIE. 8012, Infrared Technology and Applications XXXVII
KEYWORDS: Microbolometers, Oxides, Vanadium, Thermography, Silica, Sensors, Resistance, Infrared radiation, Aluminum, Temperature metrology

Proceedings Article | 21 May 2011
Proc. SPIE. 8012, Infrared Technology and Applications XXXVII
KEYWORDS: Amorphous silicon, Microbolometers, Oxides, Sputter deposition, Metals, Nickel, Resistance, Heat treatments, Oxygen, Oxidation

Proceedings Article | 4 May 2010
Proc. SPIE. 7660, Infrared Technology and Applications XXXVI
KEYWORDS: Amorphous silicon, Bolometers, Microbolometers, Oxides, Thin films, Metals, Nickel, Resistance, Oxygen, Electrical engineering

Proceedings Article | 7 May 2009
Proc. SPIE. 7298, Infrared Technology and Applications XXXV
KEYWORDS: Amorphous silicon, Bolometers, Oxides, Thin films, Sensors, Nickel, Resistance, Atomic force microscopy, Oxygen, Infrared radiation

Showing 5 of 6 publications
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