Dr. Dong Liu Profile

Dr. Dong Liu

at Zhejiang Univ

SPIE Involvement:

Author

Publications (6)

Proceedings Article | 24 October 2017 Paper

Paper

Testing of an off-axis parabolic mirror based on hybrid compensation technology

Lisong Yan, Donglin Ma, Ximeng Han, Yongliang Jiang, Li Qiang, Weicai Xu, Yulei Wang, Yongying Yang, Dong Liu

Proceedings Volume 10463, 1046314 (2017) https://doi.org/10.1117/12.2284389

KEYWORDS: Off axis mirrors, Mirrors

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Proceedings Article | 15 October 2012 Paper

Paper

Study on distortion correction for image mosaic of surface defects

Shitong Wang, Dong Liu, Xiaoyu Chen, Pin Cao, Yongying Yang

Proceedings Volume 8417, 84173H (2012) https://doi.org/10.1117/12.976028

KEYWORDS: Distortion, Defect detection, Optical testing, Image processing, Imaging systems, Scattering, Optical components, MATLAB, Calibration, Microscopes

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Proceedings Article | 15 October 2012 Paper

Paper

Research on reconstruction of spatial density distribution using optical interferometry and tomography

Tong Ling, Dong Liu, Chao Tian, Lei Sun, Yongying Yang

Proceedings Volume 8420, 84200H (2012) https://doi.org/10.1117/12.976053

KEYWORDS: Refractive index, Reconstruction algorithms, Beam splitters, Tomography, Shearing interferometers, Computed tomography, Optical tomography, Optical interferometry, Computing systems, Testing and analysis

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Proceedings Article | 15 October 2012 Paper

Paper

Research on digital calibration method for optical surface defect dimension

Xiaoyu Chen, Dong Liu, Shitong Wang, Pin Cao, Xin Gao, Yongying Yang

Proceedings Volume 8417, 84173L (2012) https://doi.org/10.1117/12.976030

KEYWORDS: Calibration, Image segmentation, Microscopes, Image processing, Quartz, Manufacturing, Precision calibration, Charge-coupled devices, CCD image sensors, Chromium

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Proceedings Article | 15 October 2012 Paper

Paper

Application of image entropy evaluation function for the leveling of large aperture components in auto defects detecting

Pin Cao, Dong Liu, Peng Zhao, Yong-ying Yang, Shi-tong Wang

Proceedings Volume 8417, 84173K (2012) https://doi.org/10.1117/12.976036

KEYWORDS: Microscopes, Defect detection, Image analysis, Scattering, Image processing, Imaging systems, Image information entropy, Light scattering, Laser scattering, Digital imaging

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Proceedings Article | 15 October 2012 Paper

Paper

New interferometric method to locate aspheric in the partial null aspheric testing system

Wei Tao, Liu Dong, Tian Chao, Zhang Lei, Yongying Yang

Proceedings Volume 8417, 84173I (2012) https://doi.org/10.1117/12.975110

KEYWORDS: Aspheric lenses, Interferometry, Ray tracing, Interferometers, Digital image processing, Zemax, Optics manufacturing, Testing and analysis, Optical testing, Collimation

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Showing 5 of 6 publications

Conference Committee Involvement (1)

Optical Sensing and Imaging Technology

26 June 2022 | Beijing, China

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