Dr. Dong Liu
at Zhejiang Univ
SPIE Involvement:
Author
Publications (6)

PROCEEDINGS ARTICLE | October 24, 2017
Proc. SPIE. 10463, AOPC 2017: Space Optics and Earth Imaging and Space Navigation
KEYWORDS: Mirrors, Off axis mirrors

PROCEEDINGS ARTICLE | October 15, 2012
Proc. SPIE. 8417, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
KEYWORDS: Microscopes, Defect detection, Imaging systems, Scattering, Image processing, Light scattering, Laser scattering, Image analysis, Digital imaging, Image information entropy

PROCEEDINGS ARTICLE | October 15, 2012
Proc. SPIE. 8417, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
KEYWORDS: Zemax, Digital image processing, Interferometers, Interferometry, Optical testing, Collimation, Ray tracing, Aspheric lenses, Testing and analysis, Optics manufacturing

PROCEEDINGS ARTICLE | October 15, 2012
Proc. SPIE. 8417, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
KEYWORDS: Microscopes, Calibration, Quartz, Image segmentation, Image processing, Manufacturing, Chromium, Charge-coupled devices, CCD image sensors, Precision calibration

PROCEEDINGS ARTICLE | October 15, 2012
Proc. SPIE. 8417, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
KEYWORDS: Optical components, Microscopes, MATLAB, Defect detection, Imaging systems, Scattering, Calibration, Image processing, Distortion, Optical testing

PROCEEDINGS ARTICLE | October 15, 2012
Proc. SPIE. 8420, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical System Technologies for Manufacturing and Testing
KEYWORDS: Refractive index, Beam splitters, Computing systems, Tomography, Optical interferometry, Computed tomography, Reconstruction algorithms, Optical tomography, Testing and analysis, Shearing interferometers

Showing 5 of 6 publications
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