Dr. Dong Wei
Assistant Professor at Nagaoka Univ of Technology
SPIE Involvement:
Author
Publications (19)

Proceedings Article | 18 November 2019
Proc. SPIE. 11189, Optical Metrology and Inspection for Industrial Applications VI
KEYWORDS: Fringe analysis, Interferometers, Fourier transforms, Reconstruction algorithms

SPIE Journal Paper | 14 August 2019
OE Vol. 58 Issue 08
KEYWORDS: Mirrors, Michelson interferometers, Signal processing, Interferometry, Laser sources, Fourier transforms, Light sources, Optical filters, Distance measurement, Electronic filtering

Proceedings Article | 21 June 2019
Proc. SPIE. 11056, Optical Measurement Systems for Industrial Inspection XI
KEYWORDS: Phase modulation, Modulation, Interferometers, Field programmable gate arrays, Demodulation, Frequency modulation

SPIE Journal Paper | 20 March 2019
OE Vol. 58 Issue 03
KEYWORDS: Interferometers, Nonlinear optics, Mirrors, Signal detection, Phase interferometry, Laser sources, Light sources, Signal processing, Optical engineering, Visualization

SPIE Journal Paper | 20 November 2018
OE Vol. 57 Issue 11
KEYWORDS: Interferometers, Mirrors, Michelson interferometers, Signal processing, Interferometry, Fringe analysis, Pulsed laser operation, Light sources, Fourier transforms, Communication theory

Showing 5 of 19 publications
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