Dr. Dongjing Miao
at National Institute of Metrology
SPIE Involvement:
Author
Publications (5)

PROCEEDINGS ARTICLE | September 27, 2016
Proc. SPIE. 9684, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment
KEYWORDS: Reflectors, Detection and tracking algorithms, Interferometers, Calibration, Error analysis, Computer simulations, Optical testing, Distance measurement, Optical tracking, Optimization (mathematics)

PROCEEDINGS ARTICLE | October 15, 2015
Proc. SPIE. 9676, AOPC 2015: Optical Design and Manufacturing Technologies
KEYWORDS: Reflectors, Eye, Lithium, Detection and tracking algorithms, Calibration, Distance measurement, Algorithm development, Optimization (mathematics), Motion controllers, Automatic tracking

PROCEEDINGS ARTICLE | March 6, 2015
Proc. SPIE. 9446, Ninth International Symposium on Precision Engineering Measurement and Instrumentation
KEYWORDS: Reflectors, Metrology, Retroreflectors, Interferometers, Error analysis, Control systems, Precision measurement, 3D metrology, Motion measurement, Environmental sensing

PROCEEDINGS ARTICLE | March 6, 2015
Proc. SPIE. 9446, Ninth International Symposium on Precision Engineering Measurement and Instrumentation
KEYWORDS: Reflectors, Refractive index, Interferometers, Sensors, Calibration, Error analysis, Interferometry, Optical testing, Bismuth, Protactinium

PROCEEDINGS ARTICLE | March 6, 2015
Proc. SPIE. 9446, Ninth International Symposium on Precision Engineering Measurement and Instrumentation
KEYWORDS: Reflectors, Interferometers, Sensors, Calibration, Interferometry, Humidity, Motion measurement, Environmental sensing, Standards development, Temperature metrology

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