Mr. Dong Ryul Kwak
at Seoul National Univ of Science and Technology
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | April 11, 2013
Proc. SPIE. 8694, Nondestructive Characterization for Composite Materials, Aerospace Engineering, Civil Infrastructure, and Homeland Security 2013
KEYWORDS: Thin films, Multilayers, Titanium, Microscopy, Silicon, Reflectivity, Platinum, Transducers, Solids, Acoustics

PROCEEDINGS ARTICLE | April 9, 2013
Proc. SPIE. 8691, Nanosensors, Biosensors, and Info-Tech Sensors and Systems 2013
KEYWORDS: Thin films, Polymethylmethacrylate, Silica, Visualization, Microscopy, Silicon, Atomic force microscopy, Silicon films, Acoustics, Semiconducting wafers

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