Dr. Dongxian Zhang Profile

Dr. Dongxian Zhang

at Zhejiang Univ

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Author

Publications (7)

Proceedings Article | 24 July 2018 Paper

Refractive index detection by using an integrated microfluidic device

Hao Wang, Qingjun Wu, Hao Jia, Cheng Jiang, J. Z. Jiang, Dongxian Zhang

Proceedings Volume 10827, 108272E (2018) https://doi.org/10.1117/12.2326821

KEYWORDS: Refractive index, Microfluidics, Silver, Liquids, Metals, Thin films, Glasses, Finite-difference time-domain method, Microsystems, Plasmonics

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Proceedings Article | 24 July 2018 Paper

Optical filter based on metallic glass MgZnCa micro/nano-structure array

Jiang Cheng, Hao Jia, Qingjun Wu, Hao Wang, J. Z. Jiang, Dongxian Zhang

Proceedings Volume 10827, 1082737 (2018) https://doi.org/10.1117/12.2326822

KEYWORDS: Nanorods, Glasses, Optical filters, Reflection, Thin films, Reflectivity, Finite-difference time-domain method, Nanolithography, Refractive index, Optical testing

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Proceedings Article | 31 December 2008 Paper

3D measurement system of micro-organization based on two-ray-path scanning

Xiaolei Shan, Dongxian Zhang, Chao Liu, Haijun Zhang

Proceedings Volume 7130, 713031 (2008) https://doi.org/10.1117/12.819668

KEYWORDS: 3D metrology, Signal processing, Light sources, Reliability, Aluminum, Optical scanning systems, Nondestructive evaluation, Microelectromechanical systems, Interferometry, Natural surfaces

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Proceedings Article | 31 December 2008 Paper

Analysis and experimentation of novel asymmetric photo-thermal micro-actuator

Chao Liu, Yulin He, Haijun Zhang, Dongxian Zhang

Proceedings Volume 7130, 713011 (2008) https://doi.org/10.1117/12.819575

KEYWORDS: Actuators, Convection, Excimer lasers, Semiconductor lasers, Manufacturing, Bridges, Laser sources, Laser systems engineering, Thermal analysis, Power supplies

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Proceedings Article | 9 February 2005 Paper

A horizontal atomic force microscope and its applications

Haijun Zhang, Dongxian Zhang, Yang Shi

Proceedings Volume 5635, (2005) https://doi.org/10.1117/12.576189

KEYWORDS: Atomic force microscopy, Feedback control, Surface finishing, Atomic force microscope, Image acquisition, Photons, Scanners, Nanotechnology, Image processing, Polishing

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Proceedings Article | 9 February 2005 Paper

A wide-range metrology AFM and its applications

Xiaofeng Lin, Haijun Zhang, Dongxian Zhang

Proceedings Volume 5635, (2005) https://doi.org/10.1117/12.576240

KEYWORDS: Atomic force microscopy, Scanners, Metrology, Scanning tunneling microscopy, Crystals, Feedback loops, Atomic force microscope, Calibration, Optical amplifiers, Scanning probe microscopes

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Proceedings Article | 9 February 2005 Paper

In situ study of corrosion with an atomic force microscope scanning in liquids

Dongxian Zhang, Haijun Zhang, Xiaofeng Lin

Proceedings Volume 5635, (2005) https://doi.org/10.1117/12.576138

KEYWORDS: Liquids, Corrosion, Atomic force microscopy, Image processing, Feedback control, Control systems, Metals, Atomic force microscope, Iron, Image acquisition

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Showing 5 of 7 publications

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