Dr. Donnacha P. Lowney
at Lawrence Berkeley National Lab
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | January 28, 2004
Proc. SPIE. 5194, Fourth-Generation X-Ray Sources and Ultrafast X-Ray Detectors
KEYWORDS: Data modeling, Sensors, X-rays, Quantum efficiency, Solids, Streak cameras, Grazing incidence, Electron transport, X-ray characterization, Absorption

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