Dr. Douglas A. Baillie Profile

Dr. Douglas A. Baillie

at Tower Semiconductor Ltd

SPIE Involvement:

Author

Publications (2)

Proceedings Article | 28 May 2004 Paper

Zero-space microlenses for CMOS image sensors: optical modeling and lithographic process development

Douglas Baillie, Jonathan Gendler

Proceedings Volume 5377, (2004) https://doi.org/10.1117/12.533453

KEYWORDS: Microlens, Microlens array, Objectives, Geometrical optics, Image sensors, Image processing, Process modeling, Lithography, Semiconductors, CMOS sensors

Read Abstract +

SPIE Journal Paper | 1 February 1995

Simple technique for out-of-focus feature alignment

Jose Sasian, Douglas Baillie

OE, Vol. 34, Issue 02, (February 1995) https://doi.org/10.1117/12.10.1117/12.194047

KEYWORDS: Optical alignment, Microscopes, Feature extraction, Microlens array, Switching, Interfaces, Geometrical optics, Optical computing, Microlens, Optical instrument design

Read Abstract +

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years