Dr. Eric Rosas
Chief Intellectual Property Officer at Centro de Investigaciones en Óptica AC
SPIE Involvement:
Senior status | Symposium Chair | Conference Chair | Author | Editor
Area of Expertise:
Optical Metrology , Lasers , Photometry , Radiometry , Solid-State Lighting , Education in Optics & Photonics
Profile Summary

Eric ROSAS is Physicist by the Universidad Autónoma del Estado de México (1994) and Doctor in Sciences (Optics) by the Universidad de Guanajuato (1998); he has worked in ESR for gamma ray dosimetry, Doppler-free saturation spectroscopy, laser resonators dynamics, Diode-pumped Solid-state lasers, holographic laser resonators, and primary photometry and radiometry. He was the 2008-2010 President of the Academia Mexicana de Óptica and also of the Comité Territorial de Óptica de México of the International Commission for Optics; the 2010-2013 President of the Red Iberoamericana de Óptica (RIAO); the 2012-2014 President of the División de Óptica of the Sociedad Mexicana de Física; and he is currently 2014-2017 RIAO appointed Vice President at the International Commission for Optics and member (2015-2017) of the International Council of The Optical Society.
Publications (14)

PROCEEDINGS ARTICLE | October 25, 2011
Proc. SPIE. 8011, 22nd Congress of the International Commission for Optics: Light for the Development of the World
KEYWORDS: Metrology, Light emitting diodes, Sensors, Calibration, Solid state lighting, Spectroscopy, Manufacturing, Control systems, Spherical lenses, Temperature metrology

PROCEEDINGS ARTICLE | October 15, 2011
Proc. SPIE. 8287, Eighth Symposium Optics in Industry
KEYWORDS: Metrology, Statistical analysis, Sensors, Calibration, Error analysis, Ions, Lamps, Head, Diffusers, Photometry

PROCEEDINGS ARTICLE | October 15, 2011
Proc. SPIE. 8287, Eighth Symposium Optics in Industry
KEYWORDS: Optical fibers, Metrology, Modulation, Calibration, Dispersion, Phase shift keying, Optical testing, Telecommunications, Picosecond phenomena, Network security

SPIE Conference Volume | October 11, 2011

PROCEEDINGS ARTICLE | December 3, 2009
Proc. SPIE. 7499, Seventh Symposium Optics in Industry
KEYWORDS: Metrology, Light emitting diodes, LED lighting, Solid state lighting, Lamps, Colorimetry, Solids, Light sources and illumination, Photometry, Luminous efficacy

PROCEEDINGS ARTICLE | December 3, 2009
Proc. SPIE. 7499, Seventh Symposium Optics in Industry
KEYWORDS: Optical filters, Metrology, Calibration, Error analysis, Lamps, Solids, Light sources and illumination, Transmittance, Absorbance, Light wave propagation

Showing 5 of 14 publications
Conference Committee Involvement (4)
Eighth Symposium Optics in Industry
9 September 2011 | Toluca de Lerdo, Mexico
Eighth Symposium Optics in Industry
9 September 2011 | Toluca de Lerdo, Mexico
Seventh Symposium on Optics in Industry
11 September 2009 | Guadalajara, Jalisco, Mexico
Fifth Symposium Optics in Industry
8 September 2005 | Santiago De Queretaro, Mexico
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