Dr. Guru Prasad A. S.
Advanced Technologist at Nanyang Technological Univ
SPIE Involvement:
Author
Publications (5)

Proceedings Article | 13 June 2017
Proc. SPIE. 10449, Fifth International Conference on Optical and Photonics Engineering
KEYWORDS: Speckle, Surface roughness, Optical metrology, Laser optics, Laser metrology, Machine vision, Speckle pattern, Error analysis, Calibration, Optical resolution

Proceedings Article | 13 June 2017
Proc. SPIE. 10449, Fifth International Conference on Optical and Photonics Engineering
KEYWORDS: Surface roughness, Speckle, Additive manufacturing, Radium, Nondestructive evaluation, Speckle metrology, Speckle pattern, Statistical analysis, Calibration, Inspection

Proceedings Article | 13 June 2017
Proc. SPIE. 10449, Fifth International Conference on Optical and Photonics Engineering
KEYWORDS: Surface roughness, Optical metrology, Laser metrology, Speckle, Image processing, Metrology, Manufacturing, Surface finishing, Nondestructive evaluation, Optics manufacturing

Proceedings Article | 11 November 2016
Proc. SPIE. 10150, Second International Seminar on Photonics, Optics, and Its Applications (ISPhOA 2016)
KEYWORDS: Imaging systems, GRIN lenses, Metrology, Lenses, Speckle metrology, Objectives, Speckle imaging, Distortion, Modulation transfer functions, Speckle

Proceedings Article | 17 July 2015
Proc. SPIE. 9524, International Conference on Optical and Photonic Engineering (icOPEN 2015)
KEYWORDS: Speckle, Inspection, Surface roughness, Image processing, Speckle pattern, Metrology, Speckle imaging, Feature extraction, Nondestructive evaluation, Optical engineering

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