Dr. Drew M. L'Esperance
at Hadland Imaging LLC
SPIE Involvement:
Author
Publications (8)

Proceedings Article | 3 September 2019 Presentation + Paper
Proc. SPIE. 11102, Applied Optical Metrology III
KEYWORDS: Imaging systems, Lenses, Cameras, Calibration, Image processing, Distortion, Digital imaging, Projection systems, Schlieren techniques

Proceedings Article | 23 August 2017 Presentation + Paper
Proc. SPIE. 10373, Applied Optical Metrology II
KEYWORDS: Mirrors, Visualization, Imaging systems, Lenses, Cameras, Calibration, Collimation, Thermal effects, Convection, Aerodynamics

Proceedings Article | 1 September 2015 Paper
Proc. SPIE. 9576, Applied Advanced Optical Metrology Solutions
KEYWORDS: Optical filters, Refractive index, Light sources, Light emitting diodes, Visualization, Imaging systems, Cameras, Image processing, Computing systems, Digital imaging

Proceedings Article | 1 September 2015 Paper
Proc. SPIE. 9576, Applied Advanced Optical Metrology Solutions
KEYWORDS: Optical filters, Imaging systems, Cameras, Calibration, Distortion, Modulators, LCDs, Projection systems, Convection, Analog electronics

SPIE Journal Paper | 8 August 2013
OE Vol. 52 Issue 08
KEYWORDS: Cameras, Streak cameras, Mirrors, Rockets, Sensors, Imaging systems, High speed photography, Digital cameras, High speed cameras, Photography

Showing 5 of 8 publications
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