Dr. Duncan L. Hickman
Director at Tektonex Ltd
SPIE Involvement:
Conference Chair | Editor | Author | Instructor
Area of Expertise:
EO/IR Sensor Design , Image & Data Processing , Systems Engineering , Modelling & Simulation , Data Analysis , Defence & Security
Websites:
Profile Summary

Founder and Director of Tektonex Ltd, a company that specialises in sensor design, processing, performance modelling, and data analysis for defence and security systems. Recent projects include the development of an FPGA-based multi-band image processing and fusion system for military vehicles, handheld imaging cameras for border security, multi-band polarimetric imaging systems, and the development of ATDR processing. Tektonex has an international portfolio of clients and partners that provide sensor hardware and camera platforms (vehicles, drones).

Prior to Tektonex, I was a Director and Chief Engineer at Waterfall Solutions, a UK-based SME business that became a preferred supplier to the UK MOD. Waterfall specialised in the development of novel image and data processing and example programmes undertaken included the design and development of a full-panoramic dual-band imaging system for maritime and vehicle-mounted applications, the design of an AI-based ATDR system, and high performance imaging cameras for police and fire services.

Previous roles included Project Engineering Manager at BAE Systems (Seawolf Point Defence System), Design-Lead and International Group Manager at Thales (Typhoon IRST, MAWS, Land Vehicles), Optics Design Authority at Marconi Space Systems, and Senior Research Officer in BAE Systems (interferometry, laser and fibre-optic systems, holography).

I have also held a number of academic posts including those at Oxford University and University of Surrey, and continue to provide invited presentations and lectures at schools and universities across the UK and internationally. My background is in theoretical and engineering physics (first degree and doctorate) and I have published over 75 technical papers and books across a broad range of EO/IR sensor related subjects. I am pleased to support SPIE and chair the EO/IR Systems Technology and Applications Conference for them.
Publications (52)

Proceedings Article | 23 October 2023 Presentation + Paper
Proceedings Volume 12737, 127370N (2023) https://doi.org/10.1117/12.2685845
KEYWORDS: Cameras, Image processing, Image quality, Sensors, Imaging systems, Design and modelling, Batteries, Control software, Artificial intelligence, UAV imaging systems

Proceedings Article | 23 October 2023 Presentation + Paper
Proceedings Volume 12737, 127370M (2023) https://doi.org/10.1117/12.2685028
KEYWORDS: Sensors, Data modeling, Radar, Error analysis, Optical sensors, Monte Carlo methods, Image processing, Performance modeling, Design and modelling, Systems modeling

Proceedings Article | 2 November 2022 Presentation + Paper
Proceedings Volume 12271, 1227108 (2022) https://doi.org/10.1117/12.2632617
KEYWORDS: Image processing, Image restoration, Cameras, Scanning probe microscopy, Image sensors, Image quality, Sensors, Automatic target recognition, Device simulation, Monte Carlo methods

Proceedings Article | 2 November 2022 Presentation + Paper
Proceedings Volume 12271, 122710A (2022) https://doi.org/10.1117/12.2657037
KEYWORDS: Image processing, Sensors, Monte Carlo methods, Modeling, Systems modeling, Performance modeling, Image quality, Cameras, Automatic target recognition, Computer simulations

Proceedings Article | 12 September 2021 Presentation + Paper
Proceedings Volume 11866, 118660F (2021) https://doi.org/10.1117/12.2597227
KEYWORDS: Signal to noise ratio, Target detection, Sensors, Point spread functions, Staring arrays, Image processing, Modeling, Image sensors, Diffraction, Modulation transfer functions

Showing 5 of 52 publications
Proceedings Volume Editor (6)

Showing 5 of 6 publications
Conference Committee Involvement (8)
Electro-optical and Infrared Systems: Technology and Applications XXI
16 September 2024 | Edinburgh, United Kingdom
Electro-optical and Infrared Systems: Technology and Applications XX
3 September 2023 | Amsterdam, Netherlands
SPIE Future Sensing Technologies
18 April 2023 | Yokohama, Japan
Electro-optical and Infrared Systems: Technology and Applications XIX
6 September 2022 | Berlin, Germany
Electro-optical and Infrared Systems: Technology and Applications XVIII and Electro-Optical Remote Sensing XV
13 September 2021 | Online Only, Spain
Showing 5 of 8 Conference Committees
Course Instructor
SC1328: Modeling and Simulation of Imaging Systems
Modeling and simulation of imaging systems is fundamental to the performance evaluation of imaging sensors, as well as becoming an increasingly important activity in the design, development, and acceptance of new camera systems. Traditionally, imaging sensors have been modeled in terms of the mathematical functions associated with hardware components such as optics and focal plane arrays. However, modern sensor systems increasingly utilize complex image and data processing which not only affects the performance characteristics but also their operational behavior. Consequently, an understanding of both the physical components and the camera processing characteristics is required to provide a realistic overall imaging system representation. This course covers all aspects associated with the modeling and simulation of imaging systems including both physical sensor components and data processing. Additionally, the interaction of the imaging system with its platform, the operating environment, and the scene characteristics are discussed. The incorporation of verification and validation approaches is also addressed, and modeling techniques are described which can be used to establish confidence in the performance predictions. Although the emphasis of the material is on infrared systems, the principles can be applied to imaging systems operating in other wavebands. The course material includes numerous cases of single and multi-band models used across a diverse range of applications such as surveillance, remote sensing, security, defense, fire and rescue, and industrial inspection.
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