Dr. Dusan Petranovic
at Mentor, a Siemens Business
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 29 March 2013 Paper
Dusan Petranovic, James Falbo, Nur Kurt-Karsilayan
Proceedings Volume 8684, 86840M (2013) https://doi.org/10.1117/12.2010838
KEYWORDS: Photomasks, Double patterning technology, Capacitance, Dielectrics, Statistical analysis, Extreme ultraviolet, Optical lithography, Visualization, Manufacturing, Image processing

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