Dr. Dustin Levy
VP, Industrial Safety at Gentex Corp
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 29 May 2013
Proc. SPIE. 8726, Next-Generation Spectroscopic Technologies VI
KEYWORDS: FT-IR spectroscopy, Statistical analysis, Sensors, Interfaces, Raman spectroscopy, Solids, Chemical analysis, Explosives, Attenuated total reflectance, Liquids

Proceedings Article | 18 May 2012
Proc. SPIE. 8374, Next-Generation Spectroscopic Technologies V
KEYWORDS: Human-machine interfaces, FT-IR spectroscopy, Statistical analysis, Visualization, Sensors, Raman spectroscopy, Solids, Chemical analysis, Attenuated total reflectance, Liquids

Proceedings Article | 12 May 2011
Proc. SPIE. 8032, Next-Generation Spectroscopic Technologies IV
KEYWORDS: FT-IR spectroscopy, Proteins, Genetic algorithms, Statistical analysis, Detection and tracking algorithms, Solids, Chemical analysis, Explosives, Attenuated total reflectance, Liquids

Proceedings Article | 29 April 2009
Proc. SPIE. 7319, Next-Generation Spectroscopic Technologies II
KEYWORDS: FT-IR spectroscopy, Sensors, Interfaces, Receivers, Raman spectroscopy, Personal digital assistants, Solids, Chemical analysis, Spectroscopes, Liquids

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top