Dr. Duy Duc Nguyen
SPIE Involvement:
Area of Expertise:
Finite Element Method (FEM) , Scanning Electron Microscopy (SEM) , Lithography , Charging Effect , Mechanical Engineering , Applied Mathematics
Profile Summary

I am a postdoct with 5+ years in modeling and simulation. My research is finding relevant model for physical phenomena related to industry and solving it numericaly, fast and accurately. Currently, I am studying charging effect occurring in SEM image.

• Strong experience in either commercial Finite Element Method (FEM) simulation software COMSOL or open computational platform FEniCS.

• Strong experience in programming and scripting languages in Python, C++, Matlab.

• 5+ years experiences in working with multidisciplinary teams which include physicists, computer scientists and mathematicians.

I am seeking for a R&D position, and also, looking to expand my network. Please feel free to contact me either through this profile or by email at duyduc.nguyen@protonmail.com.
Publications (2)

Proceedings Article | 26 March 2019 Presentation + Paper
Proc. SPIE. 10959, Metrology, Inspection, and Process Control for Microlithography XXXIII
KEYWORDS: Electron beams, Image processing, Silicon, Diffusion, Scanning electron microscopy, Signal processing, Finite element methods

Proceedings Article | 19 September 2018 Paper
Proc. SPIE. 10775, 34th European Mask and Lithography Conference
KEYWORDS: Electron beam lithography, Metrology, Silicon, Diffusion, 3D modeling, Scanning electron microscopy, Monte Carlo methods, Finite element methods

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