Mr. E. Lee Stein
Design Engineer - Electrical Automation & Controls at
SPIE Involvement:
Membership & Communities Committee | Author | Student Chapter President
Area of Expertise:
Dielectric Breakdown of Ultra Thin Composite Films , Passive Millimeter Wave Imaging (35 and 94 GHz) , Passive & Active Millimeter Wave Polarization Phenomenology , High Accuracy Themal Measurements (4.2°K to 573.1°K) , Robust Digital Lock-in Algorithms (via LSM) , High Frequency Anechoic Chamber Design and Construction
Websites:
Profile Summary

Worked for W.L. Gore & Associates for 7 years as an Electrical & Materials Research Engineer and as a Design Engineer for the Electronic Products Division, Machine Design Group at our New Garden facility, located in Landenberg, Pennsylvania.
Publications (10)

PROCEEDINGS ARTICLE | October 12, 2010
Proc. SPIE. 7837, Millimetre Wave and Terahertz Sensors and Technology III
KEYWORDS: Target detection, Extremely high frequency, Millimeter wave imaging, Polarization, Imaging systems, Sensors, Atmospheric propagation, Environmental sensing, Dielectric polarization, Visibility

PROCEEDINGS ARTICLE | September 24, 2009
Proc. SPIE. 7485, Millimetre Wave and Terahertz Sensors and Technology II
KEYWORDS: Extremely high frequency, Polarization, Imaging systems, Sensors, Image processing, Fourier transforms, Image sensors, Modulation transfer functions, Millimeter wave sensors, Targeting Task Performance metric

PROCEEDINGS ARTICLE | September 24, 2009
Proc. SPIE. 7485, Millimetre Wave and Terahertz Sensors and Technology II
KEYWORDS: Data modeling, Polarization, Visualization, Imaging systems, Sensors, Calibration, Data acquisition, Antennas, Temperature metrology, Absorption

PROCEEDINGS ARTICLE | September 24, 2009
Proc. SPIE. 7485, Millimetre Wave and Terahertz Sensors and Technology II
KEYWORDS: Point spread functions, Optical filters, Extremely high frequency, Microlens array, Imaging systems, Sensors, Etching, Fourier transforms, Image filtering, Antennas

PROCEEDINGS ARTICLE | May 5, 2009
Proc. SPIE. 7309, Passive Millimeter-Wave Imaging Technology XII
KEYWORDS: Diffraction, Point spread functions, Extremely high frequency, Millimeter wave imaging, Imaging systems, Sensors, Image resolution, Antennas, Upconversion, Spatial resolution

PROCEEDINGS ARTICLE | May 5, 2009
Proc. SPIE. 7309, Passive Millimeter-Wave Imaging Technology XII
KEYWORDS: Extremely high frequency, Polarization, Reflection, Imaging systems, Image processing, Reflectivity, 3D modeling, Upconversion, Passive millimeter wave imaging, Dielectric polarization

Showing 5 of 10 publications
Conference Committee Involvement (1)
SPIE DSS Conference - Session Chairperson
1 April 2009 |
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