Dr. Eun-mi Park
at Sungkyunkwan University
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | December 24, 2013
Proc. SPIE. 9067, Sixth International Conference on Machine Vision (ICMV 2013)
KEYWORDS: Semiconductors, Data mining, Electronics, Data modeling, Semiconductor manufacturing, Semiconducting wafers, Wafer testing, Binary data, Fuzzy logic, Communication engineering

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