Dr. Eddy R. Simoen
Sr. Researcher at IMEC
SPIE Involvement:
Author
Publications (4)

PROCEEDINGS ARTICLE | January 8, 2013
Proc. SPIE. 8700, International Conference Micro- and Nano-Electronics 2012
KEYWORDS: Oxides, Silica, Dielectrics, Silicon, Diagnostics, Nondestructive evaluation, Capacitance, Solids, Field effect transistors

PROCEEDINGS ARTICLE | March 4, 2010
Proc. SPIE. 7640, Optical Microlithography XXIII
KEYWORDS: Oxides, Quantum wells, Germanium, Dielectrics, Interfaces, Gallium arsenide, Silicon, Field effect transistors, Heterojunctions, Nanowires

PROCEEDINGS ARTICLE | May 25, 2004
Proc. SPIE. 5470, Noise in Devices and Circuits II
KEYWORDS: Oxides, Silicon, Resistance, Time metrology, Ionization, Measurement devices, Transistors, Field effect transistors, Semiconducting wafers, Semiconductor physics

PROCEEDINGS ARTICLE | May 25, 2004
Proc. SPIE. 5470, Noise in Devices and Circuits II
KEYWORDS: Oxides, Oscillators, Switching, Denoising, Dielectrics, Transistors, Field effect transistors, CMOS technology, Analog electronics, System on a chip

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