Dr. Edmund K. Banghart
Semiconductor Device Physics & Simulation at
SPIE Involvement:
Author
Publications (3)

PROCEEDINGS ARTICLE | February 10, 2006
Proc. SPIE. 6069, Digital Photography II
KEYWORDS: Microlens, Quantum efficiency, Image sensors, Charge-coupled devices, Oxides, CCD image sensors, Sensors, Optical filters, Cameras, Metals

PROCEEDINGS ARTICLE | April 28, 2005
Proc. SPIE. 5722, Physics and Simulation of Optoelectronic Devices XIII
KEYWORDS: Charge-coupled devices, Electrons, Process modeling, Instrument modeling, TCAD, 3D modeling, Imaging systems, Clocks, Doping, Image processing

PROCEEDINGS ARTICLE | February 23, 2005
Proc. SPIE. 5678, Digital Photography
KEYWORDS: Electrodes, Charge-coupled devices, Imaging systems, Doping, Dielectrics, Silicon, Data modeling, Numerical simulations, Arsenic, Oxidation

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