Edmund Pierzchala
at Mentor Graphics Corp
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | March 13, 2009
Proc. SPIE. 7275, Design for Manufacturability through Design-Process Integration III
KEYWORDS: Logic, Clocks, Ions, Manufacturing, Design for manufacturing, Optical proximity correction, Picosecond phenomena, Critical dimension metrology, Digital electronics, Yield improvement

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top