Dr. Edward J. Danielewicz Profile

Dr. Edward J. Danielewicz

President at Danielewicz Design and Engineering LLC

SPIE Involvement:

Author

Publications (5)

SPIE Journal Paper | 10 July 2012

Absorption measurement of high-reflectance coated mirrors at 193 nm with a Shack-Hartmann wavefront sensor

Byungil Cho, Edward Danielewicz, J. Earl Rudisill

OE, Vol. 51, Issue 12, 121803, (July 2012) https://doi.org/10.1117/12.10.1117/1.OE.51.12.121803

KEYWORDS: Mirrors, Absorption, Silica, Wavefront distortions, Wavefront sensors, Thin film coatings, Excimer lasers, Distortion, Adaptive optics, Optical testing

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SPIE Journal Paper | 10 July 2012

193-nm-laser-induced spectral shift in HR coated mirrors

Byungil Cho, J. Earl Rudisill, Edward Danielewicz

OE, Vol. 51, Issue 12, 121804, (July 2012) https://doi.org/10.1117/12.10.1117/1.OE.51.12.121804

KEYWORDS: Coating, Reflectivity, Mirrors, Crystals, Diffusion, X-ray diffraction, Aluminum, Oxides, Refractive index, Dielectrics

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Proceedings Article | 28 November 2011 Paper

Absorption measurement of HR coated mirrors at 193nm with a Shack-Hartmann wavefront sensor

Byungil Cho, Edward Danielewicz, J. Earl Rudisill

Proceedings Volume 8190, 81901P (2011) https://doi.org/10.1117/12.898943

KEYWORDS: Mirrors, Absorption, Silica, Wavefront distortions, Wavefront sensors, Adaptive optics, Excimer lasers, Distortion, Thin film coatings, Deep ultraviolet

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Proceedings Article | 1 December 2010 Paper

Laser induced damage threshold of 266 AR coatings with different coating designs

Byungil Cho, Edward Danielewicz, J. Earl Rudisill

Proceedings Volume 7842, 78420B (2010) https://doi.org/10.1117/12.867105

KEYWORDS: Coating, Antireflective coatings, Silica, Laser induced damage, Reflectivity, Laser damage threshold, Interfaces, Temperature metrology, Absorption, Laser irradiation

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Proceedings Article | 31 December 2009 Paper

193 nm laser induced spectral shift in HR coated mirrors

Byungil Cho, J. Earl Rudisill, Edward Danielewicz

Proceedings Volume 7504, 750409 (2009) https://doi.org/10.1117/12.836262

KEYWORDS: Coating, Reflectivity, Mirrors, Crystals, Diffusion, Oxides, X-ray diffraction, Dielectrics, Interferometers, Refractive index

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