Edward Kah Ching Teoh
at Motivo Inc
SPIE Involvement:
Author
Publications (5)

Proceedings Article | 3 April 2017
Proc. SPIE. 10148, Design-Process-Technology Co-optimization for Manufacturability XI
KEYWORDS: Pattern recognition, Yield improvement, Computational lithography, Databases, Manufacturing, Integrated circuit design, Machine learning, Analytics, Integrated circuits, Design for manufacturability, Optical proximity correction, Product engineering, Lithography, Statistical analysis, Metrology, Computer simulations

Proceedings Article | 26 March 2015
Proc. SPIE. 9427, Design-Process-Technology Co-optimization for Manufacturability IX
KEYWORDS: Manufacturing, Metals, Design for manufacturing, Raster graphics, Image classification, Data modeling, Statistical analysis, Design for manufacturability, Current controlled current source, Optimization (mathematics)

Proceedings Article | 28 March 2014
Proc. SPIE. 9053, Design-Process-Technology Co-optimization for Manufacturability VIII
KEYWORDS: Raster graphics, Manufacturing, Metals, Electronic design automation, Profiling, Design for manufacturability, Design for manufacturing, Optical alignment, Multilayers, Databases

Proceedings Article | 28 March 2014
Proc. SPIE. 9053, Design-Process-Technology Co-optimization for Manufacturability VIII
KEYWORDS: Manufacturing, Image classification, Raster graphics, Databases, Image processing, Optical proximity correction, Silicon, Data mining, Tolerancing, Lithography

Proceedings Article | 15 March 2012
Proc. SPIE. 8327, Design for Manufacturability through Design-Process Integration VI
KEYWORDS: Lithography, Simulation of CCA and DLA aggregates, Laser Doppler velocimetry, Design for manufacturability, Transistors, Silicon, Standards development, Design for manufacturing, Instrument modeling, Current controlled current source

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top