Dr. Edwin M. Westbrook
Director
SPIE Involvement:
Author | Instructor
Publications (13)

Proceedings Article | 20 January 2004 Paper
Timothy Thorson, Roger Durst, Dan Frankel, Rex Bordwell, Jose Camara, Edward Leon-Guerrero, Steven Onishi, Francis Pang, Paul Vu, Edwin Westbrook
Proceedings Volume 5198, (2004) https://doi.org/10.1117/12.505710
KEYWORDS: Cameras, Charge-coupled devices, Sensors, X-ray diffraction, CCD cameras, Back illuminated sensors, CCD image sensors, Electrons, Imaging systems, Electronics

Proceedings Article | 10 January 2003 Paper
John Morse, Christopher Kenney, Edwin Westbrook, Istvan Naday, Sherwood Parker
Proceedings Volume 4784, (2003) https://doi.org/10.1117/12.451164
KEYWORDS: Sensors, Silicon, Electrodes, X-rays, X-ray detectors, Crystals, Semiconducting wafers, Crystallography, Oxides, Etching

Proceedings Article | 10 January 2003 Paper
Edwin Westbrook, John Morse, Robert Fischer, William McGuigan, Steven Onishi, Paul Vu, Istvan Naday, C. Bauer, J. Phillips, T. Thorson, Roger Durst
Proceedings Volume 4784, (2003) https://doi.org/10.1117/12.451165
KEYWORDS: Sensors, Fiber optics, Charge-coupled devices, Energy efficiency, Fiber optics sensors, Energy transfer, CCD image sensors, Lens design, Prototyping, X-rays

Proceedings Article | 6 October 1999 Paper
Proceedings Volume 3774, (1999) https://doi.org/10.1117/12.367113
KEYWORDS: Sensors, Crystals, Diffraction, Charge-coupled devices, Synchrotrons, X-rays, Proteins, X-ray detectors, Silicon, CCD image sensors

Proceedings Article | 6 October 1999 Paper
Istvan Naday, R. Sanishvili, A. Joachimiak, Edwin Westbrook, Anthony Jorden, Paul Loeffen
Proceedings Volume 3774, (1999) https://doi.org/10.1117/12.367124
KEYWORDS: Sensors, Charge-coupled devices, Diffraction, X-rays, Crystallography, Crystals, Proteins, CCD image sensors, Data acquisition, X-ray detectors

Showing 5 of 13 publications
Proceedings Volume Editor (3)

SPIE Conference Volume | 10 January 2003

SPIE Conference Volume | 10 January 2003

Conference Committee Involvement (5)
Ultrafast X-Ray Detectors and Applications II
31 July 2005 | San Diego, California, United States
Ultrafast X-Ray Detectors and Applications
6 August 2003 | San Diego, California, United States
X-Ray and Gamma-Ray Detectors and Applications IV
8 July 2002 | Seattle, WA, United States
X-Ray Detectors
7 July 2002 | Seattle, WA, United States
Detectors for Crystallography and Diffraction Studies at Synchrotron Sources
19 July 1999 | Denver, CO, United States
Course Instructor
SC408: Crystallographic X-Ray Detector Technology
This course compares and contrasts a variety of technologies that can be applied to the design and manufacture of detectors for the crystallographic analysis of biological macromolecules. Successful existing detector systems are studied to examine what attributes are required for a good detector in this field. The course examines where improvements can be made with existing technologies, and identifies new technologies showing promise for future development. In particular, design attributes that make a good detector for applications at synchrotron sources are contrasted to those attributes that make a good detector on a laboratory X-ray source.
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