Dr. Ehud Fuchs Profile

Dr. Ehud Fuchs

at Zyvex Labs

SPIE Involvement:

Author

Publications (6)

Proceedings Article | 9 April 2024 Presentation + Paper

Atomically precise advanced manufacturing for 2D bipolar devices

J. H. Owen, R. Santini, M. Haq, E. Fuchs, J. Randall

Proceedings Volume 12956, 129560C (2024) https://doi.org/10.1117/12.3011900

KEYWORDS: Scanning tunneling microscopy, Optical alignment, Dopants, Automatic alignment, Silicon, Lithography, Manufacturing, Quantum processes, Nanoelectronics

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Proceedings Article | 1 May 2023 Presentation + Paper

Scalable digital atomic precision lithography

Ehud Fuchs, James Owen, Afshin Alipour, Emma Fowler, S. O. Reza Moheimani, John Randall

Proceedings Volume 12497, 124970G (2023) https://doi.org/10.1117/12.2661599

KEYWORDS: Lithography, Scanning tunneling microscopy, Electron beam lithography, Microelectromechanical systems, Actuators, Scanners, Silicon, Control systems, Quantum fields, Electrons

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Proceedings Article | 5 March 2021 Presentation + Paper

Infrared scanning near-field optical microscopy (IR-SNOM) for thermal profiling of quantum cascade lasers

Trey Daunis, F. Abbas, Kevin Clark, E. Fuchs, K. Lascola, Y. Dikmelik, Kimari Hodges, Dennis Robbins, Max Platkov, Abraham Katzir, Q. Gu, Katy Roodenko

Proceedings Volume 11635, 116350Z (2021) https://doi.org/10.1117/12.2585911

KEYWORDS: Quantum cascade lasers, Near field scanning optical microscopy, Thermography, Infrared radiation, Optical microscopy, Thermal modeling, Profiling, Infrared lasers, Mid-IR, Long wavelength infrared

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Proceedings Article | 5 March 2021 Presentation

Identifying surface elements in STM images using neural networks

Ehud Fuchs

Proceedings Volume 11635, 116350W (2021) https://doi.org/10.1117/12.2585276

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Proceedings Article | 23 March 2020 Presentation + Paper

Atomically precise digital e-beam lithography

J. Randall, J. H. Owen, E. Fuchs, R. Saini, R. Santini, S. O. R. Moheimani

Proceedings Volume 11324, 113240X (2020) https://doi.org/10.1117/12.2552083

KEYWORDS: Electron beam lithography, Manufacturing, Silicon, Chemical species, Scanning tunneling microscopy, Error control coding, Information technology, Fabrication, Lithography

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Proceedings Article | 31 January 2020 Presentation + Paper

IR-SNOM on a fork: infrared scanning near-field optical microscopy for thermal profiling of quantum cascade lasers

B.-J. Pandey, K. P. Clark, F. Abbas, E. Fuchs, K. Lascola, Yamac Dikmelik, D. Hinojos, K. Hodges, D. Robbins, M. Platkov, A. Katzir, A. Suliman, G. Spingarn, A. Niguès, J.-F. Veyan, Q. Gu, K. Roodenko

Proceedings Volume 11288, 112881Q (2020) https://doi.org/10.1117/12.2543849

KEYWORDS: Thermography, Quantum cascade lasers, Near field scanning optical microscopy, Spatial resolution, Temperature metrology, Infrared imaging, Infrared radiation, Modulation, Near field

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Showing 5 of 6 publications

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