Einat H. Louzon
at Soreq Nuclear Research Ctr
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 7 June 2006
Proc. SPIE. 6261, High-Power Laser Ablation VI
KEYWORDS: Ionization, Laser damage threshold, Dielectrics, Silicon, Gallium arsenide, Pulsed laser operation, Picosecond phenomena, Semiconductors, Laser induced damage, Plasma

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