Einav Namer
at Technion-Israel Institute of Tech
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 18 August 2005
Proc. SPIE. 5888, Polarization Science and Remote Sensing II
KEYWORDS: Polarization, Cameras, Air contamination, Polarizers, Distortion, Image analysis, Liquid crystals, Image filtering, Transmittance, Visibility

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