Dr. Ekua N. Bentil
at
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | February 3, 2009
Proc. SPIE. 7230, Novel In-Plane Semiconductor Lasers VIII
KEYWORDS: Wafer-level optics, Lithography, Etching, Quantum cascade lasers, Electroluminescence, Laser damage threshold, Semiconducting wafers, Pulsed laser operation, Wafer testing, Temperature metrology

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