Eleanor F. Howick
at Callaghan Innovation
SPIE Involvement:
Author
Publications (7)

Proceedings Article | 6 July 2018 Paper
Dijana Bogunovic, Graeme Jonas , Dave Cochrane, Andrew Rakich, Peter Connor, Abe Romeril, Jimi Romeril, Luke Gers, Eleanor Howick , Chris Young, Tony Reed, Ian Tosh, Émilie Lhomé, Kevin Dee, Gavin Dalton , Scott Trager, Jose Alfonso Lopez Aguerri , Piercarlo Bonifacio , Antonella Vallenari , Esperanza Carrasco , Don Carlos Abrams, Kevin Middleton
Proceedings Volume 10700, 107003A (2018) https://doi.org/10.1117/12.2312342
KEYWORDS: Optical spheres, Lenses, Interferometers, Telescopes, Wavefronts, Interferometry, Optics manufacturing, Optical testing, Astronomical telescopes, Lens manufacturing

Proceedings Article | 21 September 2007 Paper
Eleanor Howick, David Cochrane, David Meier
Proceedings Volume 6676, 66760L (2007) https://doi.org/10.1117/12.733345
KEYWORDS: Tolerancing, Optical alignment, Assembly tolerances, Optical components, Manufacturing, Optical spheres, Optics manufacturing, Optical fabrication, Surface finishing, Computer simulations

Proceedings Article | 20 November 2003 Paper
Proceedings Volume 5190, (2003) https://doi.org/10.1117/12.503649
KEYWORDS: Mirrors, Calibration, Retroreflectors, Distance measurement, Reflectors, Receivers, Telescopes, Interferometers, Laser systems engineering, Cameras

Proceedings Article | 20 November 2003 Paper
Proceedings Volume 5190, (2003) https://doi.org/10.1117/12.503650
KEYWORDS: Calibration, Error analysis, Optical testing, Optical components, Mirrors, Surface finishing, Optics manufacturing, Time metrology, Monte Carlo methods, Optical mounts

Proceedings Article | 22 October 2001 Paper
Eleanor Howick, Christopher Sutton
Proceedings Volume 4401, (2001) https://doi.org/10.1117/12.445611
KEYWORDS: Calibration, Head, Interferometers, Laser systems engineering, Sensors, Signal detection, Photodiodes, Semiconductor lasers, Sensing systems, Projection systems

Showing 5 of 7 publications
Conference Committee Involvement (2)
Recent Developments in Traceable Dimensional Measurements III
31 July 2005 | San Diego, California, United States
Recent Developments in Traceable Dimensional Measurements II
4 August 2003 | San Diego, California, United States
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