Eleanor F. Howick
at Callaghan Innovation
SPIE Involvement:
Conference Program Committee | Author
Publications (7)

PROCEEDINGS ARTICLE | July 6, 2018
Proc. SPIE. 10700, Ground-based and Airborne Telescopes VII
KEYWORDS: Telescopes, Optical spheres, Lenses, Interferometers, Interferometry, Wavefronts, Optical testing, Astronomical telescopes, Optics manufacturing, Lens manufacturing

PROCEEDINGS ARTICLE | September 21, 2007
Proc. SPIE. 6676, Optical System Alignment and Tolerancing
KEYWORDS: Optical components, Optical spheres, Manufacturing, Computer simulations, Optical fabrication, Optical alignment, Tolerancing, Optics manufacturing, Assembly tolerances, Surface finishing

PROCEEDINGS ARTICLE | November 20, 2003
Proc. SPIE. 5190, Recent Developments in Traceable Dimensional Measurements II
KEYWORDS: Optical components, Mirrors, Calibration, Error analysis, Optical testing, Monte Carlo methods, Time metrology, Optical mounts, Optics manufacturing, Surface finishing

PROCEEDINGS ARTICLE | November 20, 2003
Proc. SPIE. 5190, Recent Developments in Traceable Dimensional Measurements II
KEYWORDS: Reflectors, Telescopes, Mirrors, Retroreflectors, Interferometers, Cameras, Calibration, Receivers, Distance measurement, Laser systems engineering

PROCEEDINGS ARTICLE | October 22, 2001
Proc. SPIE. 4401, Recent Developments in Traceable Dimensional Measurements
KEYWORDS: Interferometers, Sensors, Calibration, Photodiodes, Semiconductor lasers, Head, Projection systems, Sensing systems, Signal detection, Laser systems engineering

PROCEEDINGS ARTICLE | October 22, 2001
Proc. SPIE. 4401, Recent Developments in Traceable Dimensional Measurements
KEYWORDS: Reflectors, Retroreflectors, Interferometers, Calibration, Optical testing, Distance measurement, Diodes, Aluminum, Temperature metrology, Laser systems engineering

Showing 5 of 7 publications
Conference Committee Involvement (2)
Recent Developments in Traceable Dimensional Measurements III
31 July 2005 | San Diego, California, United States
Recent Developments in Traceable Dimensional Measurements II
4 August 2003 | San Diego, California, United States
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