Elena Prokopyeva
at Brno Univ of Technology
SPIE Involvement:
Author
Publications (7)

PROCEEDINGS ARTICLE | December 23, 2016
Proc. SPIE. 10142, 20th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics
KEYWORDS: Refractive index, Optical properties, Scattering, Sensors, Light scattering, Monte Carlo methods, Tissue optics, Photon transport, Absorption, Anisotropy

PROCEEDINGS ARTICLE | January 7, 2015
Proc. SPIE. 9442, Optics and Measurement Conference 2014
KEYWORDS: Optical imaging, Diffraction, Optical design, Polarization, Optical properties, Reflection, Organisms, Atomic force microscopy, Geometrical optics, Natural surfaces

PROCEEDINGS ARTICLE | January 7, 2015
Proc. SPIE. 9442, Optics and Measurement Conference 2014
KEYWORDS: Statistical analysis, Etching, Argon, Interferometry, Atomic force microscopy, Optoelectronics, Wet etching, Plasma etching, Silicon carbide, Semiconducting wafers

PROCEEDINGS ARTICLE | January 7, 2015
Proc. SPIE. 9442, Optics and Measurement Conference 2014
KEYWORDS: Gold, Prisms, Optical properties, Nanoparticles, Metals, Glasses, Particles, Biosensors, Refraction, Biological research

PROCEEDINGS ARTICLE | January 7, 2015
Proc. SPIE. 9442, Optics and Measurement Conference 2014
KEYWORDS: Polarization, Optical properties, Tissues, Scattering, Ions, Light scattering, Geometrical optics, Tissue optics, In vitro testing, Absorption

PROCEEDINGS ARTICLE | September 24, 2013
Proc. SPIE. 8825, Reliability of Photovoltaic Cells, Modules, Components, and Systems VI
KEYWORDS: Photovoltaics, Solar cells, Silicon, Resistance, Diagnostics, Optical testing, Scanning electron microscopy, Silicon solar cells, Ion beams, Semiconducting wafers

Showing 5 of 7 publications
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