Dr. Eliezer Weiss
VP Technologies at SCD SemiConductor Devices
SPIE Involvement:
Conference Program Committee | Author
Publications (20)

PROCEEDINGS ARTICLE | May 20, 2016
Proc. SPIE. 9819, Infrared Technology and Applications XLII
KEYWORDS: Staring arrays, Readout integrated circuits, Long wavelength infrared, Polishing, Sensors, Diffusion, Quantum efficiency, Gallium antimonide, Superlattices, Single crystal X-ray diffraction

PROCEEDINGS ARTICLE | June 4, 2015
Proc. SPIE. 9451, Infrared Technology and Applications XLI
KEYWORDS: Staring arrays, Readout integrated circuits, Long wavelength infrared, Mid-IR, Sensors, Diffusion, Quantum efficiency, Diodes, Superlattices, Single crystal X-ray diffraction

PROCEEDINGS ARTICLE | June 24, 2014
Proc. SPIE. 9070, Infrared Technology and Applications XL
KEYWORDS: Staring arrays, Readout integrated circuits, Mid-IR, Sensors, Diffusion, Interference (communication), Image quality, Detector development, Diodes, Single crystal X-ray diffraction

PROCEEDINGS ARTICLE | June 24, 2014
Proc. SPIE. 9070, Infrared Technology and Applications XL
KEYWORDS: Staring arrays, Long wavelength infrared, Mid-IR, Indium arsenide, Sensors, Diffusion, Quantum efficiency, Diodes, Superlattices, Absorption

PROCEEDINGS ARTICLE | June 18, 2013
Proc. SPIE. 8704, Infrared Technology and Applications XXXIX
KEYWORDS: Staring arrays, Signal to noise ratio, Mid-IR, Sensors, Diffusion, Gallium antimonide, Atmospheric sensing, Atmospheric optics, Temperature metrology, Single crystal X-ray diffraction

PROCEEDINGS ARTICLE | May 31, 2012
Proc. SPIE. 8353, Infrared Technology and Applications XXXVIII
KEYWORDS: Staring arrays, Signal to noise ratio, Mid-IR, Sensors, Diffusion, Quantum efficiency, Diodes, Atmospheric optics, Temperature metrology, Single crystal X-ray diffraction

Showing 5 of 20 publications
Conference Committee Involvement (1)
Infrared Photoelectronics
30 August 2005 | Warsaw, Poland
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