Elif Nallar
at Technische Univ München
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 21 June 2019
Proc. SPIE. 11056, Optical Measurement Systems for Industrial Inspection XI
KEYWORDS: Image processing algorithms and systems, Detection and tracking algorithms, Sensors, Image segmentation, Image processing, Laser processing, Laser applications, Quantization, Image filtering

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