Elizaveta Mrozovskaya
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 31 January 2022 Paper
Proceedings Volume 12157, 1215710 (2022) https://doi.org/10.1117/12.2624612
KEYWORDS: Transistors, Annealing, Oxides, Silicon, Sensors, Data modeling, Absorption, Temperature metrology, Semiconductors, Calibration

Proceedings Article | 15 March 2019 Paper
Proceedings Volume 11022, 110220I (2019) https://doi.org/10.1117/12.2521703
KEYWORDS: Transistors, Silicon, Instrument modeling, Radiation effects, Electronics, Sensors, Oxides, Radiation dosimetry, Space sensors, Calibration, Ionizing radiation effects

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