Dr. Emily J. Cook
at Univ College London
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | May 1, 2009
Proc. SPIE. 7310, Non-Intrusive Inspection Technologies II
KEYWORDS: Diffraction, Data modeling, Sensors, Databases, Photons, X-rays, X-ray diffraction, Collimators, Collimation, Systems modeling

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