Mr. Emmanuel Mercado Sotelo
Research Assistant at Univ of New Mexico
SPIE Involvement:
Author
Area of Expertise:
Semiconductor laser characterization , Electrical/optical instrumentation , Test systems engineering , Test process support engineering , Telecommunications , Statistical process control
Profile Summary

Multidisciplinary professional with broad experience in the fields of test systems engineering, test process support engineering, software systems engineering and telecommunications electronic products manufacturing and improvement always interested in solving challenging problems.
Publications (1)

PROCEEDINGS ARTICLE | March 14, 2013
Proc. SPIE. 8619, Physics and Simulation of Optoelectronic Devices XXI
KEYWORDS: Transparency, Data modeling, Laser applications, Resistance, Semiconductor lasers, Diodes, Laser damage threshold, Optics manufacturing, Cryogenics, Temperature metrology

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