Elastic scattering intensity calculations at 90° and 0° for the transverse electric and transverse magnetic polarized light were performed at 1200nm for a 50 μm radius and 3.5 refractive index silicon microsphere. The mode spacing between morphology dependent resonances was found to be 1.76 nm. The linewidth of the morphology dependent resonances was observed to be 0.02 nm, which leads to a quality factor on the order of 10<sup>4</sup>.
A silicon microsphere coupled to a silica optical fiber half coupler is excited using a diode laser operating at 1.55 μm. The transmitted and the 90o elastically scattered light signals are modulated with an electrical square wave applied to the silicon microsphere.