Enhai Zhao
at Georgia Institute of Technology
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | June 8, 2007
Proc. SPIE. 6600, Noise and Fluctuations in Circuits, Devices, and Materials
KEYWORDS: Oxides, Transparency, Remote sensing, Silicon, Resistance, Measurement devices, Transistors, Analog electronics, Temperature metrology, Virtual colonoscopy

PROCEEDINGS ARTICLE | May 23, 2005
Proc. SPIE. 5844, Noise in Devices and Circuits III
KEYWORDS: Oxides, Ionizing radiation, Resistance, Physics, Amplifiers, Transistors, Analog electronics, Signal detection, Tolerancing, Temperature metrology

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