Dr. Enrico Masetti
at ENEA
SPIE Involvement:
Conference Program Committee | Author
Publications (17)

PROCEEDINGS ARTICLE | June 10, 2004
Proc. SPIE. 5273, Laser-Induced Damage in Optical Materials: 2003
KEYWORDS: Oxides, Visible radiation, Microscopy, Resistance, Optical coatings, Transmittance, Aluminum, Synchrotron radiation, Lanthanum, Vacuum ultraviolet

PROCEEDINGS ARTICLE | February 25, 2004
Proc. SPIE. 5250, Advances in Optical Thin Films
KEYWORDS: Refractive index, Optical spheres, Silica, Scattering, Sensors, Interfaces, Light scattering, Reflectivity, Spectrophotometry, Scatter measurement

PROCEEDINGS ARTICLE | May 30, 2003
Proc. SPIE. 4932, Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization
KEYWORDS: Polishing, Resistance, Reflectivity, Transmittance, Synchrotrons, Synchrotron radiation, Vacuum ultraviolet, Hard x-rays, Free electron lasers, Surface finishing

PROCEEDINGS ARTICLE | November 2, 2000
Proc. SPIE. 4099, Optical Metrology Roadmap for the Semiconductor, Optical, and Data Storage Industries
KEYWORDS: Thin films, Ellipsometry, Refractive index, Polarization, Optical properties, Sensors, Optical coatings, Polarimetry, Associative arrays, Diffraction gratings

PROCEEDINGS ARTICLE | March 3, 2000
Proc. SPIE. 3902, Laser-Induced Damage in Optical Materials: 1999
KEYWORDS: Thin films, Refractive index, Magnesium fluoride, Silica, Laser induced damage, Ultraviolet radiation, Calcium, Surface roughness, Laser damage threshold, Photoacoustic spectroscopy

PROCEEDINGS ARTICLE | September 7, 1999
Proc. SPIE. 3738, Advances in Optical Interference Coatings
KEYWORDS: Oxides, Thin films, Refractive index, Sputter deposition, Water, Ceramics, Reflectivity, Solids, Thin film deposition, Absorption

Showing 5 of 17 publications
Conference Committee Involvement (1)
Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies
3 August 2003 | San Diego, California, United States
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