Eric S. Bailey
Optical Engineer at Leidos Inc
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 30 December 2008 Paper
Eric Bailey, Nicholas Confer, Vanessa Lutzke, Dana Drochner, Kyle Vircks, James Hamilton
Proceedings Volume 7132, 71321M (2008) https://doi.org/10.1117/12.804018
KEYWORDS: Polymers, Laser damage threshold, Optical coatings, Semiconducting wafers, Contamination, YAG lasers, Laser optics, Optics manufacturing, Laser induced damage, Silicon

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