Eric S. Bailey
Optical Engineer at Leidos Inc
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 30 December 2008
Proc. SPIE. 7132, Laser-Induced Damage in Optical Materials: 2008
KEYWORDS: Contamination, Polymers, Laser induced damage, Silicon, Optical coatings, Laser damage threshold, YAG lasers, Semiconducting wafers, Laser optics, Optics manufacturing

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