Eric Beisser
CEO at XYALIS
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Publications (6)

Proceedings Article | 26 September 2019
Proc. SPIE. 11148, Photomask Technology 2019
KEYWORDS: Packaging, Consumer electronics, Lithography, Metrology, Databases, Image processing, Silicon, Photomasks, Semiconducting wafers

Proceedings Article | 8 March 2016
Proc. SPIE. 9778, Metrology, Inspection, and Process Control for Microlithography XXX
KEYWORDS: Lithography, Metrology, Optical lithography, Databases, Image processing, Control systems, Image registration, Photomasks, Neodymium, Overlay metrology

Proceedings Article | 28 June 2013
Proc. SPIE. 8701, Photomask and Next-Generation Lithography Mask Technology XX
KEYWORDS: Switches, Switching, Databases, Metals, Power supplies, Transistors, Computer aided design, Resistors, Algorithm development, Electronic design automation

Proceedings Article | 28 June 2013
Proc. SPIE. 8701, Photomask and Next-Generation Lithography Mask Technology XX
KEYWORDS: Mirrors, Multilayers, Clocks, Capacitors, Databases, Metals, Silicon, Transistors, Computer aided design, Analog electronics

Proceedings Article | 14 October 2011
Proc. SPIE. 8166, Photomask Technology 2011
KEYWORDS: Reticles, Optical lithography, Manufacturing, Photomasks, Optical proximity correction, Semiconducting wafers, Yield improvement, Lead, Instrument modeling, Chemical mechanical planarization

Showing 5 of 6 publications
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