Eric Burkam
Development Manager at Engis Corp
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | October 11, 2015
Proc. SPIE. 9633, Optifab 2015
KEYWORDS: Diamond, Polishing, Particles, Surface roughness, Image analysis, Shape analysis, Abrasives, Silicon carbide, Radium, Surface finishing

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top